Nanometer-scale Defect Detection Using Polarized Light
| By: | Pierre-Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9781848219366 |
| eText ISBN: | 9781119329688 |
| Edition: | 1 |
| Format: | Reflowable |
eBook Features
Instant Access
Purchase and read your book immediately
Read Offline
Access your eTextbook anytime and anywhere
Study Tools
Built-in study tools like highlights and more
Read Aloud
Listen and follow along as Bookshelf reads to you
Details
Table of Contents